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Die Bedeutung interferometerischer Messtechnik für die MikroOptik Reinhard Völkel , Martin Eisner, Kenneth J. Weible SUSS MicroOptics, Neuchtel Schweiz

Die Bedeutung interferometerischer Messtechnik für die ... · Historisches Holo-Lab ... „Lens Array Lithography ... Microsoft PowerPoint - SUSS MicroOptics - WEB.ppt Author: Voelkel

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Die Bedeutung interferometerischerMesstechnik für die MikroOptik

Reinhard Völkel, Martin Eisner, Kenneth J. Weible

SUSS MicroOptics, Neuchâtel Schweiz

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Warum ist Messtechnik für MikroOptik so wichtig?Warum Johannes für die MikroOptik so wichtig ist!!

1987

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1987: Der Optische Computer

! Am Rechenzentrum der Uni wurden die Lochkarten abgeschafft

! Prof. Lohmann fegte jeden vom Tennisplatz

! Speckles wurden noch ordentlich maskiert

! Willi feierte rauschende Feste am Geisberg

! Norbert kam von Bell Labs, Johannes vom ZOS

Wirklich prägend für diese Epoche war ein Bild →

Historisch interessant ist, dass sowohl beim optischen Computer als auch beidiesem Bild wichtige Details übersehen wurden.

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Holographische Linsen in Dichromatgelatine

Die Kombination optischer Computer und Holographie war unschlagbar!

Historisches Holo-Lab

488 nm → 633 nm

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→ Spot-DiagrammWie vermisst man eine holographische Linse?

Messtechnik für Holographische Linsen?

nicht korrigiertkorrigiert

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Twyman-Green Interferometer ist bessere Lösung!

nicht korrigiert

korrigiert

1992

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Es gibt keine Messtechnik für Mikrolinsen!

1994

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1995: Bill Hugle‘s Mikrolinsen-Lithographie

Bill Hugle

Patent 1992:„Lens Array Lithography“ Lösungsansatz:

+1 Abbildung mit invertiertemZwischenbild!

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h‘

h1Principle Ray

L1 L2

OBJ IMAG

Telescope I Telescope II

EL2EL1

Field Aperture

System Aperture

h1

h‘

h1h1Principle Ray

L1 L2

OBJ IMAG

Telescope I Telescope II

EL2EL1

Field Aperture

System Aperture

h1h1

1995: Bill Hugle‘s Mikrolinsen-Lithographie

Bill Hugle

Benfits:

• 0.8 mm working distance• large depth of focus• telecentric projection

Fully symmetic system

• no coma, astigmatism• telecentric imaging• aspheric microlenses

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Karl Süss Neuchâtel - SUSS MicroOptics

1999 Reinraum für MikrolinsenproduktionØ200 mm Wafers (Quarz und Silizium)

2002 Gründung SUSS MicroOptics

SUSS RC8, ACS200SUSS DV13SUSS KT-22SUSS MA8SUSS MA/BA6SUSS DSM8STS-ICP

TWG-InterferometerMZ-InterferometerWyko NT3300Foothill KT-22

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Our Products and Services

SUSS MicroOptics is a leading supplier for ! Refractive Microlens Arrays

! Fiber Collimators and Couplers

! Diffusers and Illumination Systems (from DUV to IR)

! Ultra-Flat Microlens Imaging Systems

SUSS MicroOptics offers ! Design of Micro-Optical Elements and Systems

! Manufacturing of Customer-Specific Micro-Optics

! Wafer-Level Packaging

! Testing and Inspection

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Optical Design - Consulting

SUSS MicroOptics profits from more than 15 years experience in the design of optical elements (diffractive and refractive) and optical systems.

SUSS MicroOptics uses the following design tools

! SILVACO Expert, IC Layout Editor (Mask-Layout)! ZEMAX-EE, Optical Design Program! RAYTRACE, Optical Design Program! Simulated Annealing and Iterative Fourier Optimization for DOEs! Rigorous Diffraction Theory for Wave Propagation

SUSS MicroOptics works closely with top-ranking research groups worldwide to support our customers in developing and improving their products.

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Refractive Microlens Arrays

Standard Specifications! 200 mm wafer size, fused silica and silicon

! Lens profiles: spheres, aspheres (k = 0 to -8)

! Lens diameter typically 50 µm to 2 mm

! Lens sag up to 50 µm

! Numerical aperture from 0.02 to 0.8

Optional Features! Double sided arrays

! Stop arrays (masking of dead space by absorbing layer)

! AR-coating, dicing

! Wafer-Level Packaging

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Testing and Inspection

Fizeau Interferometer for Wafer InspectionFlatness of wafer surfaces, parallelity front- and backside

Foothill Instruments KT-22, Film Thickness MetrologyUniformity of photoresist coatings

Phase Shifting Twyman-Green Interferometer (Schwider)Deviation from sphere or asphere, radius of curvature (ROC)

Phase Shifting Mach-Zehnder Interferometer (Schwider)Wave aberrations, focal length, NTF, PSF (wavelength 633nm)

Wyko NT3300 Surface Profiler, White Light InterferometerAutomatic full wafer testing for ROC, profile, surface roughness

SUSS MicroTec DSM-8, Double-Side Alignment TestAlignment accuracy of micro-optical structures front/backside, total system

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Mach-Zehnder Interferometer: Strehl 0.99

Tested by Heidi Ottevaere, VUB - Lab for Photonics (TONA-TW),Brussel, BELGIUM

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Illumination Mask Aligner: Flat-Top Diffuser

Exposure OpticsEllipsoidal mirror

ShutterCondenser lens Light sensor

Mask & Wafer

Mirror

Diffractionred. Optics Front Lens

rrorCold light mi

Exposure OpticsEllipsoidal mirror

ShutterCondenser lens Light sensor

Mask & Wafer

Mirror

Diffractionred. Optics Front Lens

rrorCold light mi

Ellipsoidal mirrorEllipsoidal mirror

ShutterShutterCondenser lensCondenser lens Light sensorLight sensor

Mask & WaferMask & Wafer

MirrorMirror

Diffractionred. OpticsDiffractionred. Optics Front LensFront Lens

rrorCold light mirrorCold light mi

Far-field intensity (arbitrary units) distribution of aspherical microlens array as forseen for illumination within a Mask Aligner MPL

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Wafer-Level Packaging

" Automatic dispensing of UV-curing optical glue on wafer

" Precise alignment in x-y-z within SUSS Mask Aligner (∆x, ∆y ≈2 µm, ∆z ≈5 µm, ∆ϕ < 0.01°).

" UV-exposure within SUSS Mask Aligner

" Dicing of complete stack of wafers

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Microlens Projection Lithography

SUSS MA150-MPL

Ultra-flat Microlens Projection Module

Extended Depth of Focus withNo Change of Critial Dimensions

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Fiber Coupling

! Sender: laser or fiber array

! Receiver: detector or fiber array

! In-between: MOEMS, lens system, switch

! Coupling efficiency up to 100%, no crosstalk

! Relaxed tolerances (shift, tilt)

! Holes or posts on backside for fiber alignment

! Lens arrays, lateral position accuracy < 0.25 µm

2003

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