28
B B eam eam I I nduced nduced F F luorescence luorescence ( ( BIF BIF ) Monitor ) Monitor for Transverse Profile Determination for Transverse Profile Determination of 5 to 750 MeV/u Heavy Ion Beams of 5 to 750 MeV/u Heavy Ion Beams F. Becker 1 , C. Andre 1 , P. Forck 1 , D.H.H. Hoffmann 1,2 1) Gesellschaft für Schwerionenforschung mbH GSI, Darmstadt 2) Technische Universität Darmstadt 1

Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

  • Upload
    others

  • View
    2

  • Download
    0

Embed Size (px)

Citation preview

Page 1: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

BBeam eam IInducednduced FFluorescenceluorescence ((BIFBIF) Monitor) Monitorfor Transverse Profile Determination for Transverse Profile Determination of 5 to 750 MeV/u Heavy Ion Beamsof 5 to 750 MeV/u Heavy Ion Beams

F. Becker1, C. Andre1, P. Forck1, D.H.H. Hoffmann1,2

1) Gesellschaft für Schwerionenforschung mbH GSI, Darmstadt2) Technische Universität Darmstadt

1

Page 2: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

OutlineOutline

• Introduction– Detectors for high beam power– BIF-detection principle

• Experiment– Setup– Data Analysis– Results

• Conclusion

2

Page 3: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Comparison of Profile MonitorsComparison of Profile Monitors

HV−electrode

IPM with 175 x 175 mm clearance

300 mm flange

MCP: 100 x 30 mm

63 wires, 2 mm spacing

beam2

Secondary-Electron-Monitor (SEM) Grid+ Standard tool, compact design+ Low background level- Limited spacial resolution (wire spacing)-- Melts in high power beams!

Residual Gas Monitor (RGM)+ Non-intercepting monitoring+ Measures even high power beams+ Very sensitive a used in synchrotrons- Lot of mechanics inside vacuum

3

Page 4: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Beam Beam InducedInduced Fluorescence (Fluorescence (BIFBIF))

ION beam

Blackened wallsVacuum gauge

Valve

Viewport

150mm flange

LensImage-IntensifierCCD FireWire-Camera

N2 as fluorescent gasequally distributed

4

Page 5: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

How a Profile is obtainedHow a Profile is obtained

5

Page 6: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

How a Profile is obtainedHow a Profile is obtained

6

Page 7: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

How a Profile is obtainedHow a Profile is obtained

7

Page 8: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Advantages of Advantages of BIFBIF

25 cmShort insertion length

No mechanics in the vacuum

8

Page 9: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Advantages of Advantages of BIFBIF

25 cmShort insertion length

No mechanics in the vacuum

Reproduction scale can be matched by the focal distance.

Image intensifier performs single photon detection.

12-bit VGA camera with digital fire-wire interface.

9

Page 10: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Advantages of Advantages of BIFBIF

25 cmShort insertion length

No mechanics in the vacuum

Reproduction scale can be matched by the focal distance.

Image intensifier performs single photon detection.

12-bit VGA camera with digital fire-wire interface.

Commercial Components

10

Page 11: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Detection PrincipleDetection Principle

Photon

Fiber optics

VG

A-C

AM

CCD

UV-enhanced S-20photocathode

Fast P-46 phosphor-screen (blue-light)

Solid angle limitedby viewport-apperture

Wide-angle lens system

Ω

Atomic collisions N2

+ ⇔Beam Ions.Excitating vibration-levels, 391 nm, 427 nm, ...

V-stack MCPHV a gain ~ 106

Single photon detection!

BEAM

11

Page 12: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Expected Photon YieldExpected Photon Yield

nn sprojectileIon

photons ldl

ZpdEπ

β4

),,( 2 Ω∆∝

~ integration time~ number of particles per pulse

l∆Ω depends on setup geometry

SYNC/ Low energy lossHEBT: typical: 60-2000 MeV/u

1010 particles per cycle

LINAC: High energy losstypical: 5-11 MeV/u2,5 mA ~ 1012 particles pp.

12

Page 13: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Areas of ApplicationAreas of Application

beam direction

viewport size

aver. pixel int.

beam direction

viewport size

aver. pixel int.

Detection-efficiency adjusted by pressure

LINAC: 2,5 mA ~ 1011 Ar10+

@4,4 MeV/u

p=5 10-6 mbarsingle shot

SYNC-HEBT: 2,3 109 Xe48+ @200 MeV/u

p=10-3 mbaraveraged over 20 shots

- Background is larger at HEBT energies

+ Application had been proven!

13

Page 14: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Areas of ApplicationAreas of Application

beam direction

viewport size

aver. pixel int.

beam direction

viewport size

aver. pixel int.

Detection-efficiency adjusted by pressure

LINAC: 2,5 mA ~ 1011 Ar10+

@4,4 MeV/u

p=5 10-6 mbarsingle shot

SYNC-HEBT: 2,3 109 Xe48+ @200 MeV/u

p=10-3 mbaraveraged over 20 shots

- Background is larger at HEBT energies

+ Application had been proven!

14

Page 15: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Pressure Variation

Signal amplitude increases proportional to p

For higher beam intensities lower pressures should be sufficient!

LINAC: 1E10 Ni(6+) @ 4.54 MeV/u and p=1E-6 mbar to p=1E-3 mbar

HEBT: 2E9 Xe(48+) @ 200 MeV/u and p=1E-3 mbar to p=1E-6 mbar

p changed by 6 orders of magnitude

15

Page 16: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Pressure Variation

Signal amplitude increases proportional to p

For higher beam intensities lower pressures should be sufficient!

LINAC: 1E10 Ni(6+) @ 4.54 MeV/u and p=1E-6 mbar to p=1E-3 mbar

HEBT: 2E9 Xe(48+) @ 200 MeV/u and p=1E-3 mbar to p=1E-6 mbar

p changed by 6 orders of magnitude

16

Page 17: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Pressure VariationPressure Variation

p changed by 6 orders of magnitude

LINAC: 1E10 Ni(6+) @ 4.54 MeV/u and p=1E-6 mbar to p=1E-3 mbar

HEBT: 2E9 Xe(48+) @ 200 MeV/u and p=1E-3 mbar to p=1E-6 mbar

Profile width remains constant → p is suitable parameter to match signal strength!

17

Page 18: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Energy VariationEnergy VariationIntegrated signal amplitude scales with Bethe-Bloch function.Good accordance for all ions normalized by their charge and mass with respect to U73+

Background level encreases with approximately E2.It is generated by thermal NEUTRONShitting the photo-cathode.

Signal to background ratio decreases two oders of magnitude.Short gating during fast extraction improves the ratio by a factor 4, for Xe and Ta.

a Background reduction is major challange!

18

Page 19: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Energy VariationEnergy VariationIntegrated signal amplitude scales with Bethe-Bloch function.Good accordance for all ions normalized by their charge and mass with respect to U73+

Background level encreases with approximately E2.It is generated by thermal NEUTRONShitting the photo-cathode.

Signal to background ratio decreases two oders of magnitude.Short gating during fast extraction improves the ratio by a factor 4, for Xe and Ta.

60 MeV/u

350 MeV/u

750 MeV/u

a Background reduction is major challange!

19

Page 20: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Background DistributionBackground Distribution

- Neutron ´afterglow´ longerthan µs beam delivery

- Simulation and experimentagree well!

⇒ Reduction by short gating (improvement: factor 4)

Simulation by PHITS:

- Neutrons are backscatteredfrom walls

- Neutron flux in whole cave

⇒ Reduction by moderation and absorbtion in shielding

20

Page 21: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Shielding ConceptShielding Concept

Effective neutron SHIELDING: Moderation and Absorbtion

Distance extension by ~1 millionfiberoptics boundlewithout loosing solid angle!

21

Page 22: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Shielding ConceptShielding Concept

Effective neutron SHIELDING: Moderation and Absorbtion

Distance extension by ~1 millionfiberoptics boundlewithout loosing solid angle!

Commercial Systems →

22

Page 23: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

How Excitation affects ProfilesHow Excitation affects Profiles

IonXN +Σ)( 12

vr

IoneBN u ++Σ −++ )( 22

vr+

)471390()( 22 nmXN g ≤≤+Σ++ λγ

hE∆

=υphoton

23

Page 24: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

How Excitation affects ProfilesHow Excitation affects Profiles

IonXN +Σ)( 12

vr

)471390()( 22 nmXN g ≤≤+Σ++ λγ

hE∆

=υphoton

IoneBN u ++Σ −++ )( 22

vr+

Vibrational spectrum [Huges, Philpot 1961]for 100 keV protons.Strongest lines at 391,4 nm and 427,8 nm.Optical glasses + photocathode have to be UV-enhanced. ~60 ns lifetime.

24

Page 25: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

How Excitation affects ProfilesHow Excitation affects Profiles

IonXN +Σ)( 12

vr

)471390()( 22 nmXN g ≤≤+Σ++ λγ

hE∆

=υphoton

IoneBN u ++Σ −++ )( 22

vr+

Vibrational spectrum [Huges, Philpot 1961]for 100 keV protons.Strongest lines at 391,4 nm and 427,8 nm.Optical glasses + photocathode have to be UV-enhanced. ~60 ns lifetime.

25

Page 26: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Fluorescence LevelsFluorescence Levels

Contribution of fluorescence levels remains constant up to p=10-3 mbar

Contribution by 2-step excitation can be neglected!

26

Page 27: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

ConclusionConclusion

• General functionality of BIF had been proven!– Profile determination in SINGLE PASS MODE!

• Careful investigation concerning:– Signal strength → linear with p, Bethe-Bl. with E– Profile width → constant with p– Background contribution → ~E2, neutron shielding– Fluorescence levels → even for high p no distortion

• Future Improvements:– Optimizing geometry, lens, intensifier and camera– Development of shielding using fiberoptics bundle– Further investigation to establish BIF as standard tool!

27

Page 28: Beam Induced Fluorescence (BIF) Monitor for Transverse ...accelconf.web.cern.ch/accelconf/d07/talks/moo3a02_talk.pdf · for Transverse Profile Determination of 5 to 750 MeV/u Heavy

Thank You

28